- Title
- The Role of the Electron Transport Layer in the Degradation of Organic Photovoltaic Cells
- Creator
- Al-Ahmad, Alaa; Vaughan, Benjamin; Holdsworth, John; Belcher, Warwick; Zhou, Xiaojing; Dastoor, Paul
- Relation
- Coatings Vol. 12, Issue 8, no. 1071
- Publisher Link
- http://dx.doi.org/10.3390/coatings12081071
- Publisher
- MDPI AG
- Resource Type
- journal article
- Date
- 2022
- Description
- The performance of the electron transport layer (ETL) plays a critical role in extending the operational lifespan of organic photovoltaic devices. ZnO is an excellent electron transport layer used in the printable organic photovoltaic cells. A comparison of Ca and ZnO as the ETL in encapsulated bulk heterojunction OPV devices has been undertaken with the device stability dependence on light soaking, temperature, irradiance, and thermal cycling recorded. It was observed that the OPV devices using Ca ETL decayed faster than the ZnO ETL devices under the same light illumination. The degradation in a Ca ETL device is ascribed to the formation of an insulating calcium oxide layer at the ETL interfaces. Photoluminescence (PL) spectroscopy revealed a higher PL signal for the degraded Ca ETL devices compared to the ZnO ETL devices. Power conversion efficiency (PCE) of the ZnO ETL devices was found to be much more stable than the Ca devices. The PCE for ZnO ETL devices still retained 40% of their initial value while the Ca ETL devices failed completely over the period of 18 days in the study, leading to a clear outcome of the study.
- Subject
- electron transport layer; light soaking; OPV degradation; SDG 7; Sustainable Development Goals
- Identifier
- http://hdl.handle.net/1959.13/1458196
- Identifier
- uon:45396
- Identifier
- ISSN:2079-6412
- Rights
- This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. https://creativecommons.org/licenses/by/4.0/
- Language
- eng
- Full Text
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